{"id":232,"date":"2022-05-20T13:00:44","date_gmt":"2022-05-20T20:00:44","guid":{"rendered":"https:\/\/als.lbl.gov\/infrared-site\/?page_id=232"},"modified":"2025-01-29T15:47:02","modified_gmt":"2025-01-29T23:47:02","slug":"5-4-overview","status":"publish","type":"page","link":"https:\/\/als.lbl.gov\/infrared-site\/5-4-overview\/","title":{"rendered":"5.4 Synchrotron Infrared Nanospectroscopy (SINS) and Microspectroscopy"},"content":{"rendered":"

Beamline 5.4 contains multiple endstations capable of operating with synchrotron IR light.\u00a0 SINS is the primary endstation at this beamline.\u00a0 The other endstations include a Continuum FTIR microscope, and a Bruker IFS high-resolution FTIR spectrometer.\u00a0 A Raman microscope is available for additional characterization capabilities.<\/h4>\n

Note: This beamline is located in an enclosure on top of the accelerator.\u00a0 Users will need to climb stairs in order to reach the endstations.<\/p>\n

\n

Endstation 5.4.1 Synchrotron Infrared Nanospectroscopy (SINS)<\/h2>\n
\"\"
SINS Endstation. The FTIR spectrometer is at the left, the Innova AFM is on the right side of the image.<\/figcaption><\/figure>\n

The SINS endstation operates with a Bruker Innova atomic force microscope (AFM) and an FTIR spectrometer. The combination of a stand-alone commercial AFM and FTIR allow for independent and precise control of multiple aspects of the data collection.<\/p>\n

This home-built system provides access and an ability to modify the setup which is not available in the Nano-FTIR system at beamline 2.4. This endstation is used extensively for R&D applications and testing new variations of scanning probe spectroscopy. The standard configuration of this endstation uses an MCT detector for spectral coverage from nominally 750 – 4000 cm-1<\/sup>.<\/p>\n

Note: Samples must be AFM compatible.<\/p>\n

Under development:
\nMagnetic Force Microscopy (MFM)
\nKelvin Force Probe Microscopy (KPFM)
\nConductive Force Microscopy (C-AFM)<\/p>\n

Please see the Manuals and Software<\/a> page for the user guide for this instrument.<\/p>\n

\n
\"\"
The Continuum microscope and FTIR.<\/figcaption><\/figure>\n

Endstation 5.4.2 Contin\u03bcum FTIR Microscope<\/h2>\n

Contact the beamline scientists prior to requesting time on this instrument; unless florescence microscopy is needed, users will be directed to the 1.4.3 Spectromicroscopy endstation for measurements with synchrotron light.<\/p>\n

Frequency Range: 600 – 10,000 cm-1<\/sup>
\nSpot Size: 3 – 10 \u03bcm (diffraction limited)
\nResolution: 0.125 cm-1<\/sup><\/p>\n

This microscope may be available for measurements with a globar source during the winter and summer shutdown periods when synchrotron light is not available.<\/p>\n

\n
\"\"
Bruker IFS 125 FTIR Spectrometer.<\/figcaption><\/figure>\n

Endstation 5.4.3 Bruker IFS 125 High-Resolution FTIR<\/h2>\n

This instrument is capable of very high spectral resolution (< 0.001 cm-1<\/sup>) typically required for gas phase and cluster measurements and contains 9 scanner chambers.\u00a0 This spectrometer is currently available with internal sources.<\/p>\n

Frequency Range: 20 – 5,000 cm-1<\/sup>
\nSpot Size: 1 mm
\nResolution: 0.001 cm-1<\/sup><\/p>\n

Contact the beamline scientists prior to requesting time on this instrument to discuss feasibility as this spectrometer is not in regular operation with the synchrotron light.<\/p>\n

\n
\"\"
Thermo DXR Raman Microscope.<\/figcaption><\/figure>\n

Raman Microscope<\/h2>\n

The Raman microscope is generally available to IR program users. Two excitation lasers are available: 532 nm and 780 nm. The 532 nm laser is the standard light source; 780 nm is used for florescence-emitting materials.<\/p>\n

Contact the beamline scientists for general access to the Raman microscope.<\/p>\n

Please see the Manuals and Software<\/a> page for the user guide for this instrument.<\/p>\n","protected":false},"excerpt":{"rendered":"

Beamline 5.4 contains multiple endstations capable of operating with synchrotron IR light.\u00a0 SINS is the primary endstation at this beamline.\u00a0 The other endstations include a Continuum FTIR microscope, and a Bruker IFS high-resolution FTIR spectrometer.\u00a0 A Raman microscope is available for additional characterization capabilities. Note: This beamline is located in an enclosure on top of […]<\/p>\n","protected":false},"author":299,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_eb_attr":"","_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"sidebar-content","footnotes":""},"categories":[],"tags":[],"class_list":{"0":"post-232","1":"page","2":"type-page","3":"status-publish","5":"entry","6":"has-post-thumbnail"},"acf":[],"_links":{"self":[{"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/pages\/232","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/users\/299"}],"replies":[{"embeddable":true,"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/comments?post=232"}],"version-history":[{"count":0,"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/pages\/232\/revisions"}],"wp:attachment":[{"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/media?parent=232"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/categories?post=232"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/als.lbl.gov\/infrared-site\/wp-json\/wp\/v2\/tags?post=232"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}