A time-resolved x-ray imaging technique directly observes signal propagation dynamics in nanomagnetic logic (NML) chains. The technique can assess NML reliability on fast time scales and help optimize chain engineering for this promising ultralow-power computing architecture. Read more »
A new measurement technique developed at the ALS is helping guide the semiconductor industry in next-generation nanopatterning techniques. NIST and IBM researchers collaborated on the technique, which allows scientists to evaluate the 3D buried features inside a film. The ALS is currently the only place in the world that has such capability.
Two research groups have recently published separate studies in which soft x-rays reveal how skyrmions—quasiparticles made up of spin vortices—react to external fields. Their work lays the foundation for understanding these fascinating constructs and eventually utilizing them in spintronic applications. Read more »
Work done on ALS Beamlines 126.96.36.199, 7.3.3, and 188.8.131.52. reveals that preferential orientation of polymer chains with respect to the fullerene domain leads to a high photovoltaic performance. Read more »