Beamline 5.4 contains multiple endstations capable of operating with synchrotron IR light. SINS is the primary endstation at this beamline. The other endstations include a Continuum FTIR microscope, and a Bruker IFS high-resolution FTIR spectrometer. A Raman microscope is available for additional characterization capabilities.
Note: This beamline is located in an enclosure on top of the accelerator. Users will need to climb stairs in order to reach the endstations.
Endstation 5.4.1 Synchrotron Infrared Nanospectroscopy (SINS)
The SINS endstation operates with a Bruker Veeco atomic force microscope (AFM) and an FTIR spectrometer. The combination of a stand-alone commercial AFM and FTIR allow for independent and precise control of multiple aspects of the data collection.
This home-built system provides access and an ability to modify the setup which is not available in the Nano-FTIR system at beamline 2.4. This endstation is used extensively for R&D applications and testing new variations of scanning probe spectroscopy. The standard configuration of this endstation uses an MCT detector for spectral coverage from nominally 750 – 4000 cm-1.
Note: Samples must be AFM compatible.
Under development:
Magnetic Force Microscopy (MFM)
Kelvin Force Probe Microscopy (KPFM)
Conductive Force Microscopy (C-AFM)
Please see the Manuals and Software page for the user guide for this instrument.
Endstation 5.4.2 Continμum FTIR Microscope
Contact the beamline scientists prior to requesting time on this instrument; unless florescence microscopy is needed, users will be directed to the 1.4.3 Spectromicroscopy endstation for measurements with synchrotron light.
Frequency Range: 600 – 10,000 cm-1
Spot Size: 3 – 10 μm (diffraction limited)
Resolution: 0.125 cm-1
This microscope may be available for measurements with a globar source during the winter and summer shutdown periods when synchrotron light is not available.
Endstation 5.4.3 Bruker IFS 124 High-Resolution FTIR
This instrument is capable of very high spectral resolution (< 0.001 cm-1) typically required for gas phase and cluster measurements and contains 9 scanner chambers. This spectrometer is currently available with internal sources.
Frequency Range: 20 – 5,000 cm-1
Spot Size: 1 mm
Resolution: 0.001 cm-1
Contact the beamline scientists prior to requesting time on this instrument to discuss feasibility as this spectrometer is not in regular operation with the synchrotron light.
Raman Microscope
The Raman microscope is generally available to IR program users. Two excitation lasers are available: 532 nm and 780 nm. The 532 nm laser is the standard light source; 780 nm is used for florescence-emitting materials.
Contact the beamline scientists for general access to the Raman microscope.
Please see the Manuals and Software page for the user guide for this instrument.