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Users Highlight Light Source Impacts in Capitol Hill Briefing

A panel of light source users participated in a briefing for Capitol Hill staff highlighting the critical role DOE x-ray light source user facilities play in advancing new technologies, the challenges posed by increasing international competition from Europe and Asia, and how next-generation upgrades to these facilities will open new scientific frontiers. Read more »

Explore the ALS in 3D and Virtual Reality

Ever wondered what’s under the ALS dome and inside the accelerator tunnels powering our light source? Now you can explore the ALS from your computer or don a VR headset (even something as simple as a Google Cardboard) and find out! Read more »

An Intern’s Vision Becomes (Virtual) Reality

For ALS Summer Intern Sam Schickler, the most exciting part about the ALS isn’t its famous dome, the particle accelerator it houses, or the x-ray experiments themselves–it’s the data. It’s why the rising 11th grader jumped at the chance to spend the summer at the ALS developing virtual reality (VR) experiences of ALS data and the ALS facility. Read more »

Early Registration for 2017 User Meeting Ends Sept. 18

Discounted early registration ends Monday, September 18, for the 2017 ALS User Meeting, which will take place October 2–4 at Berkeley Lab. The ALS Users’ Executive Committee (UEC) and meeting organizers have assembled a full program featuring news from DOE, keynote talks, and science highlights, as well as 13 focused workshops, a student poster “slam,” and the presentation of awards at the annual banquet. To register and view the draft agenda and logistical information, visit the User Meeting webpage. Read more »

In Situ Electrical Resistance and X-Ray Tomography Study of Copper–Tin Polymer Composites during Thermal Annealing

In situ electrical conductivity and x-ray tomography experiments were conducted on a conductive polymer composite containing polyvinylidene fluoride (PVDF) copolymer, copper (Cu), and tin (Sn) during thermal annealing. This study provides detailed insight into the morphological origins of the beneficial effect of thermal annealing on the electrical properties of conductive composites containing low melting metal fillers. Read more »