Beamline 11.0.1.2
Resonant Soft X-Ray Scattering
Current status | Operational; open to general users |
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ALS-U Status | This beamline will temporarily close at the start of the ALS-U dark time and will resume operations after a commissioning period. For more information, see ALS-U Beamline Impacts and other ALS-U web pages. |
Source | EPU5 |
Minimum energy (eV) | 165 |
Maximum energy (eV) | 1,500 |
Research areas |
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Technique category |
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Flux/Brightness | 1013 photons/s/0.1%BW at 800 eV |
Resolving power | 4000 at 800 eV |
Access modes |
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Additional notes | Polarization is user selectable; linear polarization continuously variable from horizontal to vertical; left and right elliptical (or circular) polarization. Spot size = 100 μm diameter. Field of view/spatial resolution = down to 2 nm resolution. Sample information: Polymer thin films, solid thin films, vacuum compatible liquid cell. Other notes: High vacuum, heating. |
Primary contact(s) | Cheng Wang |
Beamline phone number | 510-495-2010 |