Berkeley Lab
Bringing Science Solutions to the World
Beamline Name Source Min Energy (eV) Max Energy (eV) Status Reasearch Areas Endstations Endstations Name Technique Category Scattering / diffraction techniques Microscopy / imaging techniques Spectroscopy techniques Additional notes Sample Information Primary contact(s) Other beamline staff 
1.4Infrared MicrospectroscopyBend0.031.40Operational; open to general users
  • Applied Sciences
  • Biological Sciences
  • Chemical Sciences
  • Energy Sciences
  • Earth & Environmental Sciences
  • Materials Sciences
  • Physical Sciences
  • 1.4.3
  • 1.4.4
  • Infrared Micro-spectroscopy
  • Infrared Micro-spectroscopy; In-Situ Mass-Spec (in development); Cryostat (variable temp: ~7 -400 K)
  • Spectroscopy
  • Microscopy/Imaging
  • Infrared microscopy
  • Infrared spectroscopy

Hans Bechtel
[email protected]
510-486-7519

Stephanie Gilbert Corder
[email protected]
510-486-7039

10.0.1Angle- and Spin-Resolved Photoelectron SpectroscopyU1017350Varies by endstation
  • Applied Sciences
  • Materials Sciences
  • Physical Sciences
  • 10.0.1.1
  • 10.0.1.2
  • High energy resolution spectrometer (HERS): Angle-resolved photoemission
  • Spin- and angle-resolved photoemission from solids (spin-ARPES)
  • Spectroscopy
  • Angle-resolved photoemission spectroscopy (ARPES)
  • Spin-resolved photoemission
  • Scienta-Omicron DA-30 spectrometer with 3D VLEED spin detector; closed-cycle liquid Helium sample refrigeration
  • solid-state crystals, thin films
  • UHV-compatible solids, Omicron plates, vacuum suitcases

Sung-Kwan Mo
[email protected]
510-495-2903

Alexei Fedorov
[email protected]
510-486-7521

10.3.2X-Ray Fluorescence Microprobe (XFM)Bend2,10017,000Operational; open to general users
  • Biological Sciences
  • Chemical Sciences
  • Energy Sciences
  • Earth & Environmental Sciences
  • Materials Sciences
  • Spectroscopy
  • Microscopy/Imaging
  • Scattering/Diffraction
  • X-ray microdiffraction
    • X-ray absorption spectroscopy (XAS)
    • X-ray fluorescence spectroscopy (XFS)

    Sirine Fakra
    [email protected]
    510-495-2106

    11.0.1PEEM3/Resonant Soft X-Ray ScatteringEPU51601,800Operational; open to general users
    • Applied Sciences
    • Biological Sciences
    • Chemical Sciences
    • Energy Sciences
    • Earth & Environmental Sciences
    • Materials Sciences
    • Physical Sciences
    • 11.0.1.1
    • 11.0.1.2
    • PEEM-3 Photoemission Electron Microscope
    • Soft X-Ray Scattering
    • Spectroscopy
    • Microscopy/Imaging
    • Scattering/Diffraction
    • Coherent scattering
    • Small-angle x-ray scattering (SAXS)
    • Wide-angle x-ray scattering (WAXS)
    • Magnetic scattering
    • Resonant scattering
    • Magnetic microscopy
    • Photoemission electron microscopy (PEEM)
    • Magnetic spectroscopy
    • X-ray absorption spectroscopy (XAS)
    • UHV, sample heating (800 K) and cooling (32 K), other holder allow for current pulses down to 1 ns, pulsed in-plane magnet fields up to 20 mT, sample rotation, voltages or currents
    • High vacuum, heating
    • 3 mm to 18 mm diameter depending on sample holder, flat, conductive surface; sample preparation with sputter surface cleaning
    • Polymer thin films, solid thin films, vacuum compatible liquid cell

    Andreas Scholl
    [email protected]
    510-486-6920

    Cheng Wang
    [email protected]
    510-486-4082

    Arthur (David) Kilcoyne
    [email protected]
    510-486-4640

    Rajesh Vilas Chopdekar
    [email protected]
    510-495-2021

    Alexander Hexemer
    [email protected]
    510-486-6435

    11.0.2Molecular Environmental ScienceEPU51602,000Operational; open to general users
    • Applied Sciences
    • Biological Sciences
    • Chemical Sciences
    • Energy Sciences
    • Earth & Environmental Sciences
    • Materials Sciences
    • Physical Sciences
    • Spectroscopy
    • Microscopy/Imaging
    • Scanning transmission x-ray microscopy (STXM)
    • Ambient-pressure photoemission spectroscopy (APXPS/APPES)
    • X-ray absorption spectroscopy (XAS)

    Hendrik Ohldag
    [email protected]
    510-486-5364

    Monika Blum
    [email protected]
    510-495-2234

    Slavomir Nemsak
    [email protected]
    510-486-5188

    Ethan Crumlin
    [email protected]
    510-486-6235

    11.3.1Nano-TomographyBend5,00017,000Under commissioning
    • Chemical Sciences
    • Energy Sciences
    • Earth & Environmental Sciences
    • Materials Sciences
    • Physical Sciences
    • Microscopy/Imaging
    • Small-molecule crystallography
    • Tomography

    Alastair MacDowell
    [email protected]
    510-486-4276

    Joseph Nichols
    [email protected]
    925-235-9165

    11.3.2EUV Lithography Photomask Imaging (SHARP)Bend501,000Operational; restricted access
    • Applied Sciences
    • Microscopy/Imaging
    • Full-field x-ray microscopy (XM)

    Patrick Naulleau
    [email protected]
    510-486-4529

    Markus Benk
    [email protected]
    510-486-5680

    Kenneth Goldberg
    [email protected]
    510-495-2261

    12.0.1EUV Lithography Nanopatterning (MET/MET5)U89292Operational; restricted access
    • Materials Sciences
    • 12.0.1.2
    • 12.0.1.4
    • EUV Dose Calibration Tool
    • 0.5 NA EUV Micro-field Exposure Tool (MET5)
    • Microscopy/Imaging
      • 4" Si wafers
      • 8" Si wafers

      Chris Anderson
      [email protected]
      510-486-7978

      12.0.2Coherent X-Ray ScatteringEPU54001,300Operational; open to general users
      • Materials Sciences
      • Physical Sciences
      • Scattering/Diffraction
      • Coherent scattering
      • Magnetic scattering
      • Resonant scattering

        Sujoy Roy
        [email protected]
        510-486-7438

        12.2.1Small-Molecule CrystallographySuperbend6,00028,000Operational; open to general users
        • Applied Sciences
        • Chemical Sciences
        • Energy Sciences
        • Materials Sciences
        • Scattering/Diffraction
        • Small-molecule crystallography

        Simon J. Teat
        [email protected]
        510-486-4457

        12.2.2Diffraction Under Non-Ambient ConditionsSuperbend6,00035,000Operational; open to general users
        • Chemical Sciences
        • Energy Sciences
        • Earth & Environmental Sciences
        • Materials Sciences
        • 12.2.2 (ES-1)
        • 12.2.2 (ES-2)
        • HP Single Crystal Diffractometer
        • Powder X-ray diffraction at non-ambient condition, laser heating, in-situ high-temperature non-ambient atmosphere
        • Scattering/Diffraction
        • X-ray diffraction (XRD)
        • Diamond anvil cells (DACs) up to 1kg
        • Samples in diamond anvil cell or capillaries. Other ancillary equipment can be accommodated on a case by case basis

        Martin Kunz
        [email protected]
        510-486-2613

        Andrew Doran
        [email protected]
        510-495-2845

         

        Bora Kalkan
        [email protected]
        510-605-0611

        12.3.1SIBYLS (Structurally Integrated BiologY for the Life Sciences) MX and SAXSSuperbend5,00017,000Operational; open to general users
        • Biological Sciences
        • Materials Sciences
        • Scattering/Diffraction
        • Small-angle x-ray scattering (SAXS)
        • Protein crystallography (PX)

        Greg Hura
        [email protected]
        510-486-5378

        12.3.2MicrodiffractionSuperbend6,00022,000Operational; open to general users
        • Earth & Environmental Sciences
        • Materials Sciences
        • Scattering/Diffraction
        • X-ray microdiffraction

        Nobumichi Tamura
        [email protected]
        510-486-6189

        2.0.1Macromolecular Crystallography (GEMINI)Undulator (unspecified)3,00018,000Under development
        • Biological Sciences
        • Scattering/Diffraction
        • Protein crystallography (PX)
        • Small-molecule crystallography

        Marc Allaire
        [email protected]
        510-495-2926

        Corie Ralston
        [email protected]
        510-486-4299

        2.1National Center for X-Ray Tomography (NCXT)Bend4001,300Operational; open to general users
        • Biological Sciences
        • Microscopy/Imaging
        • Full-field x-ray microscopy (XM)
        • Tomography

        Mark Le Gros
        [email protected]
        510-486-6892

        Carolyn Larabell
        [email protected]
        510-486-5890

        Jian-Hua Chen
        [email protected]
        510-486-7076

        2.4Synchrotron Infrared Nanospectroscopy (SINS) and ImagingBend0.040.50Operational; open to general users
        • Applied Sciences
        • Biological Sciences
        • Chemical Sciences
        • Energy Sciences
        • Earth & Environmental Sciences
        • Materials Sciences
        • Physical Sciences
        • 2.4.1
        • 2.4.2
        • Synchrotron Infrared Nano-Spectroscopy
        • Infrared Microspectroscopic Imaging
        • Spectroscopy
        • Microscopy/Imaging
        • Infrared microscopy
        • Infrared spectroscopy
        • This instrument is currently only available with the internal globar source. Please talk to the beamline staff to discuss your science needs.
        • Samples must be AFM compatible

        Hans Bechtel
        [email protected]
        510-486-7519

        Stephanie Gilbert Corder
        [email protected]
        510-486-7039

        3.2.1X-Ray FootprintingBend3,00012,000Operational; restricted access
        • Biological Sciences
        • X-Ray Footprinting

          Corie Ralston
          [email protected]
          510-495-2594

          Sayan Gupta
          [email protected]
          510-486-4287

          3.3.1X-Ray FootprintingBend3,00012,000Under development
          • Biological Sciences
          • X-Ray Footprinting

              Corie Ralston
              [email protected]
              510-486-4299

              3.3.2General X-Ray Testing StationBend4,00020,000Operational; restricted access
              • Applied Sciences
              • Materials Sciences
              • Spectroscopy
              • Microscopy/Imaging
              • Scattering/Diffraction
              • X-ray diffraction (XRD)
              • Full-field x-ray microscopy (XM)
              • X-ray absorption spectroscopy (XAS)

              Alastair MacDowell
              [email protected]
              510-486-4276

              Chris Rosen

              [email protected]
              510-486-5651

               

              4.0.2Magnetic Spectroscopy and ScatteringEPU54001,500Operational; open to general users
              • Applied Sciences
              • Materials Sciences
              • Physical Sciences
              • Vector Magnet
              • Resonant X-Ray Scattering
              • Superconducting Vector Magnet
              • X-ray detected ferromagnetic resonance (XFMR)
              • Spectroscopy
              • Scattering/Diffraction
              • Magnetic scattering
              • Resonant scattering
              • Magnetic spectroscopy
              • X-ray absorption spectroscopy (XAS)
              • X-ray magnetic circular dichroism (XMCD); x-ray magnetic linear dichroism (XMLD); orbital polarization and interface studies. Magnetic fields up to 0.5 T in any direction; Sample temperature 15-750 K; electron yield, fluorescence yield, and luminescence yield detection, plus transmission mode
              • Resonant soft x-ray diffraction (RSXD); x-ray resonant magnetic reflectometry (XRMR); resonant elastic x-ray scattering (REXS). Sample temperature 15-320 K; Detectors: Photodiode (7 decades) or CCD (16-bit); 2-theta: 0 - 160 deg, incidence: 0 - 180 deg; chi: 0 - 90 deg; Optional magnetic field: ~0.3 T out-of-plane OR ~0.1 T in-plane
              • Magnetic fields up to 4 T in any direction; Sample temperature 15-300 K; electron yield and luminescence yield detection
              • Coplanar RF waveguide 0.5–4 GHz; Magnetic field up to 0.5 T; Sample temperature 20–320 K; Luminescence yield detection; Transverse FMR, sensitive to phase of precession
              • Solid samples
              • Solid samples
              • Solid samples
              • Thin films on luminescent substrates (e.g., Al2O3, MgO)

              Padraic Shafer
              [email protected]
              510-486-7102

              Christoph Klewe
              [email protected]
              510-486-6692

              4.0.3High-Resolution Spectroscopy of Complex Materials (MERLIN)EPU910150Operational; open to general users
              • Applied Sciences
              • Energy Sciences
              • Materials Sciences
              • Spectroscopy
              • Scattering/Diffraction
              • Resonant inelastic x-ray scattering (RIXS)
              • Angle-resolved photoemission spectroscopy (ARPES)
              • X-ray absorption spectroscopy (XAS)
              • X-ray emission spectroscopy (XES)

              Yi-De Chuang (RIXS and battery endstation)
              [email protected]
              510-495-2328

              Jonathan Denlinger (ARPES)
              [email protected]
              510-486-5648

              4.2.2Macromolecular Crystallography (MBC)Superbend7,00015,000Operational; open to general users
              • Biological Sciences
              • Scattering/Diffraction
              • Protein crystallography (PX)

              Jay Nix
              [email protected]
              707-567-7535

              Jane Tanamachi
              [email protected]

              5.0.1Macromolecular Crystallography (BCSB)Wiggler12,70012,700Operational; open to general users
              • Biological Sciences
              • Scattering/Diffraction
              • Protein crystallography (PX)

              Marc Allaire
              [email protected]
              510-495-2621

              Corie Ralston
              [email protected]
              510-495-2594

              5.0.2Macromolecular Crystallography (BCSB)Wiggler5,00016,000Operational; open to general users
              • Biological Sciences
              • Scattering/Diffraction
              • Protein crystallography (PX)

              Marc Allaire
              [email protected]
              510-495-2621

              Corie Ralston
              [email protected]
              510-495-2594

              5.0.3Macromolecular Crystallography (BCSB)Wiggler12,70012,700Operational; open to general users
              • Biological Sciences
              • Scattering/Diffraction
              • Protein crystallography (PX)

              Marc Allaire
              [email protected]
              510-495-2621

              Corie Ralston
              [email protected]
              510-495-2594

              5.3.2.1Scanning Transmission X-Ray Microscopy (STXM)Bend6002,000Restricted access
              • Applied Sciences
              • Energy Sciences
              • Earth & Environmental Sciences
              • Materials Sciences
              • Spectroscopy
              • Microscopy/Imaging
              • Scanning transmission x-ray microscopy (STXM)
              • Ptychography
              • X-ray absorption spectroscopy (XAS)

              David Kilcoyne

              [email protected]

              510.486.4640

              5.3.2.2Polymer Scanning Transmission X-Ray Microscopy (STXM)Bend250780Operational; open to general users
              • Applied Sciences
              • Biological Sciences
              • Chemical Sciences
              • Energy Sciences
              • Earth & Environmental Sciences
              • Materials Sciences
              • Physical Sciences
              • Spectroscopy
              • Microscopy/Imaging
              • Scanning transmission x-ray microscopy (STXM)
              • X-ray absorption spectroscopy (XAS)

              Matthew Marcus
              [email protected]
              510-486-7604

              David Shapiro
              [email protected]
              510-486-7628

              5.4Synchrotron Infrared Nanospectroscopy (SINS) and MicrospectroscopyBend0.051.40Operational; open to general users
              • Applied Sciences
              • Biological Sciences
              • Chemical Sciences
              • Energy Sciences
              • Earth & Environmental Sciences
              • Materials Sciences
              • Physical Sciences
              • 5.4.1
              • 5.4.2
              • 5.4.3
              • SINS
              • Infrared Micro-Spectroscopy
              • Ultra-High Spectral Resolution IR Spectroscopy
              • Spectroscopy
              • Microscopy/Imaging
              • Infrared microscopy
              • Infrared spectroscopy
              • Spectral resolution < 0.001 cm-1; Currently available with internal sources
              • must be AFM compatible

              Hans Bechtel
              [email protected]
              510-486-7519

              Stephanie Gilbert Corder
              [email protected]
              510-486-7039

              6.0.1Energy, Catalytic, and Chemical Science (AMBER)U32502,500Under commissioning
              • Chemical Sciences
              • Energy Sciences
              • Earth & Environmental Sciences
              • Materials Sciences
              • Spectroscopy
              • Scanning transmission x-ray microscopy (STXM)
              • Resonant inelastic x-ray scattering
              • X-ray absorption spectroscopy (XAS)
              • X-ray emission spectroscopy (XES)
              • X-ray fluorescence spectroscopy (XFS)

              Jinghua Guo
              [email protected]
              510-495-2230

              Per-Anders Glans
              [email protected]
              510-486-7336

              6.0.2Double-Dispersion RIXS (QERLIN)EPU3.52901,500Under development
              • Materials Sciences
              • Physical Sciences
              • Spectroscopy
              • Scattering/Diffraction
              • Resonant inelastic x-ray scattering (RIXS)
              • X-ray absorption spectroscopy (XAS)
              • X-ray emission spectroscopy (XES)

              Yi-De Chuang
              [email protected]
              510-495-2328

              6.1.2Full-Field Transmission Soft X-Ray MicroscopyBend3001,000Operational; open to general users
              • Applied Sciences
              • Energy Sciences
              • Materials Sciences
              • Physical Sciences
              • Microscopy/Imaging
              • Magnetic microscopy
              • Full-field x-ray microscopy (XM)
              • Tomography

              Mi-Young Im
              [email protected]
              510-486-6902

              Seno Rekawa
              [email protected]
              510-486-6622

              6.3.1Magnetic Spectroscopy/Materials ScienceBend2502,000Operational; open to general users
              • Energy Sciences
              • Materials Sciences
              6.3.1Magnetic Spectroscopy and Mapping
              • Spectroscopy
              • Magnetic spectroscopy
              • X-ray absorption spectroscopy (XAS)
              Solid materials: e.g. single crystals, thin films, and powders in total electron yield (TEY), luminescence yield, or transmission mode

              Alpha N’Diaye
              [email protected]
              510-486-5926

              6.3.2Calibration, Optics Testing, SpectroscopyBend251,300Operational; open to general users
              • Materials Sciences
              • Spectroscopy

                Eric Gullikson
                [email protected]
                510-486-6646

                Julia Meyer-Ilse
                [email protected]
                 

                7.0.1Coherent Scattering and Microscopy (COSMIC)EPU3.82502,500Under commissioning
                • Applied Sciences
                • Biological Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                7.0.1.2COSMIC Imaging
                • Spectroscopy
                • Microscopy/Imaging
                • Scattering/Diffraction
                • Coherent scattering
                • Resonant scattering
                • Scanning transmission x-ray microscopy (STXM)
                • Ptychography
                • Tomography
                • X-ray absorption spectroscopy (XAS)
                Any TEM compatible

                David Shapiro
                [email protected]
                510-486-7628

                7.0.2Quantum Materials Growth and Electronic Structure (MAESTRO)EPU7201,000Operational; open to general users
                • Applied Sciences
                • Energy Sciences
                • Materials Sciences
                • Physical Sciences
                • 7.0.2.1
                • 7.0.2.2
                • 7.0.2.3
                • microARPES (µARPES)
                • nanoARPES (nARPES)
                • LEEM/PEEM
                • Spectroscopy
                • Microscopy/Imaging
                • Photoemission electron microscopy (PEEM)
                • Scanning photoemission spectroscopy (SPEM)
                • Scanning transmission x-ray microscopy (STXM)
                • Angle-resolved photoemission spectroscopy (ARPES)
                • Photoelectron spectroscopy
                • X-ray absorption spectroscopy (XAS)
                • LEED; detachable evaporator; Au, alkali metal deposition; sputtering
                • In-situ heating and sample growth; LEEM capability
                • samples 10 μm to 25 mm; resistive or ebeam heating
                • samples must be prepared in external chamber and transferred in vacuo
                • 9 mm max diameter (will upgrade later to Omicron holders)

                Eli Rotenberg
                [email protected]

                Aaron Bostwick
                [email protected]

                Chris Jozwiak
                [email protected]

                7.3.1High-Pressure In Situ Soft X-Ray Spectroscopy (HPISX)Bend2501,400Operational; open to general users
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Spectroscopy
                • X-ray absorption spectroscopy (XAS)

                Jinghua Guo
                [email protected]
                510-495-2230

                Yi-Sheng Liu
                [email protected]
                510-495-2663

                Per-Anders Glans-Suzuki
                [email protected]
                510-486-7336

                7.3.3Small- and Wide-Angle X-Ray Scattering (SAXS / WAXS / GISAXS)Bend10,00010,000Operational; open to general users
                • Applied Sciences
                • Biological Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                • Scattering/Diffraction
                • Small-angle x-ray scattering (SAXS)
                • Wide-angle x-ray scattering (WAXS)
                • Grazing-incidence SAXS/WAXS
                • X-ray diffraction (XRD)

                Eric Schaible
                [email protected]
                510-495-2665

                 

                Chenhui Zhu
                [email protected]
                510-486-4395

                8.0.1Surface and Materials Science (RIXS)U5801,250Operational; open to general users
                • Applied Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                • 8.0.1.1
                • 8.0.1.2
                • 8.0.1.3
                • 8.0.1.4
                • iRIXS
                • Beamline 8.0 Open Port
                • qRIXS
                • wetRIXS
                • Spectroscopy
                • Scattering/Diffraction
                • Resonant inelastic x-ray scattering (RIXS)
                • X-ray absorption spectroscopy (XAS)
                • X-ray emission spectroscopy (XES)
                • X-ray fluorescence spectroscopy (XFS)
                • Online Manual: http://bl8.lbl.gov/
                • This is an open port to host rollup endstations/users
                • UHV-compatible samples; up to 2 cm in diameter; 5-mm diameter optimal
                • Endstation dependent
                • solid state samples
                • Solid, liquid, gas, static cells, flow cells

                Wanli Yang
                [email protected]
                510-486-4989

                Jinghua Guo
                [email protected]
                510-495-2230

                Yi-Sheng Liu
                [email protected]
                510-486-7831

                Yi-de Chuang
                [email protected]
                510-495-2328

                8.2.1Macromolecular Crystallography (BCSB/HHMI)Superbend6,00018,000Operational; open to general users
                • Applied Sciences
                • Biological Sciences
                • Energy Sciences
                • Materials Sciences
                • Scattering/Diffraction
                • Protein crystallography (PX)

                Marc Allaire
                [email protected]
                510-495-2621

                Corie Ralston
                [email protected]
                510-495-2594

                8.2.2Macromolecular Crystallography (BCSB/HHMI)Superbend6,00018,000Operational; open to general users
                • Applied Sciences
                • Biological Sciences
                • Chemical Sciences
                • Energy Sciences
                • Materials Sciences
                • Scattering/Diffraction
                • Protein crystallography (PX)

                Marc Allaire
                [email protected]
                510-495-2621

                Corie Ralston
                [email protected]
                510-495-2594

                8.3.1Macromolecular Crystallography (TomAlberTron)Superbend5,00017,000Operational; open to general users
                • Biological Sciences
                • 8.3.1
                • 8.3.1 In-Situ
                • Tom-Alber-Tron
                • In-Situ Tray Goniometer
                • Scattering/Diffraction
                • Protein crystallography (PX)
                • Small-molecule crystallography
                • X-ray diffraction (XRD)
                • User-changeable motorized collimators: 100, 75 50, 30 20 microns diameter

                  Goniometer is fast air-bearing spindle capable of "true" MAD with round-robin inverse beam and wavelength changes

                  Sample Manipulator Huber XYZ stage 1.1 micron rms sphere of confusion

                • Sample temperature adjustable from 100-300K

                  "Cool Hand Luke" Robot accepts all major pin types (Hampton, Yale, SPINE, etc.) and lengths (10-24 mm) and supports "delayed data collection mode" where data collection runs are deferred to the end of the shift. This robot does not work directly with cassettes because hand-mounting of samples in the mini-hutch is faster than any robot.

                • All SBS compliant crystallization trays supported

                  Thin-walled in-situ ready trays such as in-situ-1 highly recommended

                  Ambient temperature only currently supported

                James Holton
                [email protected]
                510-928-5556

                George Meigs
                [email protected]
                510-520-1423

                8.3.2Tomography (micro-CT)Superbend6,00043,000Operational; open to general users
                • Applied Sciences
                • Biological Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                • Microscopy/Imaging
                • Tomography

                Dula Parkinson
                [email protected]
                510-289-0897

                Harold Barnard
                [email protected]
                510-486-4318

                Alastair MacDowell
                [email protected]
                510-486-4276

                9.0Chemical TransformationsU107.50750Varies by endstation
                • Chemical Sciences
                • Energy Sciences
                • Materials Sciences
                • Physical Sciences
                • 9.0.1
                • 9.0.2
                • Soft X-ray branch, open port. Photon energy 15-750 eV
                • Vacuum Ultraviolet (VUV) branch, 4 open ports. Photon energy 7.5-24 eV
                • Spectroscopy
                • Mass spectrometry
                • Photoelectron spectroscopy
                • X-ray absorption spectroscopy (XAS)
                • Soft X-ray branch delivers 15-750 eV photons with resolving power up to 7000. Current VMI endstation can perform XPS and NEXAFS on gas-phase unsupported nanoparticles
                • Two open ports deliver monochromatized light, two - undulator radiation. Different endstations can be attached to open ports. Most of them use mass-spectrometry to collect photoionization curves of unknown gas-phase species.
                • Gas-phase samples

                Oleg Kostko
                [email protected]
                510-486-7706

                Bruce Rude
                [email protected]
                510-495-2476

                Kevin Wilson
                [email protected]
                510-495-2474

                Musahid (Musa) Ahmed
                [email protected]
                510-486-6355

                9.3.1Tender X-Ray SpectroscopyBend2,3206,000Under commissioning
                • Applied Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                • Tender APXPS
                • HAXPES (Hard X-ray Photoemission Spectroscopy)
                • Spectroscopy
                • Ambient-pressure photoemission spectroscopy (APXPS/APPES)
                • X-ray absorption spectroscopy (XAS)
                • In-situ X-ray reflectivity
                • Pressures: < 20 Torr, solid/liquid and solid/solid interface XPS
                • up to 10x10 mm^2

                Ethan Crumlin
                [email protected]
                510-486-6235

                Slavomir Nemsak
                [email protected]
                510-486-5188

                Monika Blum
                [email protected]
                510-495-2234

                9.3.2Ambient-Pressure Soft X-Ray Photoelectron Spectroscopy (S-APXPS)Bend200900Operational; open to general users
                • Applied Sciences
                • Chemical Sciences
                • Energy Sciences
                • Earth & Environmental Sciences
                • Materials Sciences
                • Physical Sciences
                Soft X-ray APXPS
                • Spectroscopy
                • Ambient-pressure photoemission spectroscopy (APXPS/APPES)
                • X-ray absorption spectroscopy (XAS)
                ideal sizes are between 7–10 mm in diameter

                Slavomir Nemsak
                [email protected]
                510-486-5188

                Ethan Crumlin
                [email protected]
                510-486-6235

                Monika Blum
                [email protected]
                510-495-2234

                Beamline Name Source Min Energy (eV) Max Energy (eV) Status Reasearch Areas Endstations Endstations Name Technique Category Scattering / diffraction techniques Microscopy / imaging techniques Spectroscopy techniques Additional notes Sample Information Primary contact(s) Other beamline staff 
                Scroll to top