Synchrotron Infrared Nano Spectroscopy (SINS)
Status | Operational; open to general users |
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Source | Bend |
Minimum energy (eV) | 0.01 |
Maximum energy (eV) | 1.50 |
Frequency range (cm-1) | 20–10,000 cm-1 |
Research areas |
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Technique category |
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Spectroscopy techniques |
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Microscopy / imaging techniques |
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Access modes |
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Primary contact(s) | Hans Bechtel Michael Martin |
Beamline website | http://infrared.als.lbl.gov |
Beamline phone number | 510-495-2654 |
Endstation 5.4.1
Name/Description | SINS |
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Status | Operational; open to general users |
Research areas |
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Technique category |
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Spectroscopy techniques |
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Microscopy/imaging techniques |
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Spot size | <20 nm |
Sample information | must be AFM compatible |
Endstation 5.4.2
Name/Description | Infrared Micro-Spectroscopy |
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Status | Operational; open to general users |
Research areas |
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Technique category |
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Spectroscopy techniques |
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Microscopy/imaging techniques |
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Spot size | 2-10 μm |
Endstation 5.4.3
Name/Description | Ultra-High Spectral Resolution IR Spectroscopy |
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Status | Operational; open to general users |
Research areas |
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Technique category |
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Spectroscopy techniques |
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Additional notes | Spectral resolution < 0.001 cm-1 |