Beamline 5.3.2.1
Scanning Transmission X-Ray Microscopy (STXM)
| Status | Restricted access |
|---|---|
| Source | Bend |
| Minimum energy (eV) | 600 |
| Maximum energy (eV) | 2,000 |
| Wavelength range (Å) | 20.7-6.2 |
| Research areas |
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| Technique category |
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| Resolving power | ≤ 5,000 |
| Access modes |
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| Additional notes | Experimental techniques include ptychography, tomography, NEXAFS spectromicroscopy at the Mn, F, Na, Fe, Co, Ni, Cu, Zn, Ga, Ge, Al, Mg, Si L/M edges |
| Primary contact(s) | David Kilcoyne ALKilcoyne@lbl.gov 510.486.4640 |
| Beamline phone number | 510-495-2057 |
