Beamline 5.3.2.1
Scanning Transmission X-Ray Microscopy (STXM)
Status | Restricted access |
---|---|
Source | Bend |
Minimum energy (eV) | 600 |
Maximum energy (eV) | 2,000 |
Wavelength range (Å) | 20.7-6.2 |
Research areas |
|
Technique category |
|
Resolving power | ≤ 5,000 |
Access modes |
|
Additional notes | Experimental techniques include ptychography, tomography, NEXAFS spectromicroscopy at the Mn, F, Na, Fe, Co, Ni, Cu, Zn, Ga, Ge, Al, Mg, Si L/M edges |
Primary contact(s) | David Kilcoyne ALKilcoyne@lbl.gov 510.486.4640 |
Beamline phone number | 510-495-2057 |