Beamline 5.3.2.1
Scanning Transmission X-Ray Microscopy (STXM)
| Current status | Restricted access |
|---|---|
| ALS-U Status | This beamline will temporarily close at the start of the ALS-U dark time and will resume operations after a commissioning period. For more information, see ALS-U Beamline Impacts and other ALS-U web pages. |
| Source | Bend |
| Minimum energy (eV) | 600 |
| Maximum energy (eV) | 2,000 |
| Wavelength range (Å) | 20.7-6.2 |
| Research areas |
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| Technique category |
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| Resolving power | ≤ 5,000 |
| Access modes |
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| Additional notes | Experimental techniques include ptychography, tomography, NEXAFS spectromicroscopy at the Mn, F, Na, Fe, Co, Ni, Cu, Zn, Ga, Ge, Al, Mg, Si L/M edges |
| Primary contact(s) | David Shapiro |
| Beamline phone number | 510-495-2057 |