Beamline 5.3.2.2
Polymer Scanning Transmission X-Ray Microscopy (STXM)
| Current status | Operational; open to general users |
|---|---|
| ALS-U Status | This beamline will temporarily close at the start of the ALS-U dark time and will resume operations after a commissioning period. For more information, see ALS-U Beamline Impacts and other ALS-U web pages. |
| Source | Bend |
| Minimum energy (eV) | 250 |
| Maximum energy (eV) | 780 |
| Research areas |
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| Technique category |
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| Flux/Brightness | 1 x 107 photons/s at sample (1.9 GeV, 500 mA) |
| Resolving power | ≤ 5,000 |
| Access modes |
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| Additional notes | Experimental techniques: NEXAFS spectromicroscopy at the C, N, O K edges and Ca, Ti, and Fe L edges |
| Primary contact(s) | Matthew Marcus David Shapiro |
| Beamline Schedule |  5322-Sched-2023-2-V5.xlsx |
| Beamline phone number | 510-495-2057 |
| Informational file |  Basic-Ops-Manual.pdf |